Shrouded test probe

ABSTRACT

A test probe includes an electrically insulating handle, an electrically conducting blade extending from the handle, an electrically insulating shroud including a first portion and a second portion that are at least partially disposed around the electrically conducting blade. A housing is attached to the handle such that the first portion of the shroud is disposed within the housing, and the second portion of the shroud extends from an aperture formed in the housing. A spring disposed between the handle and the shroud biases the shroud toward the aperture formed in the housing. The shroud protects the electrically conducting blade from unintentional contact with a conductor during testing. When the test probe is correctly positioned on a device being tested, the shroud retracts into the housing exposing the electrically conducting blade. When the test probe is moved away from the device, the shroud returns to its original position.

BACKGROUND Technical Field

The present disclosure relates generally to test probe devices, and morespecifically to test probes having conductive probe tips that contactelectrical conductors of devices under test and have retractable shroudsdisposed around the probe tips.

Description of the Related Art

Test probes have been used to connect electronic test equipment todevices in order for the test equipment to take measurements used totest the operation of those devices. For example, test probes have beenused to connect electronic test equipment to perform three-phaseelectric current and voltage testing of electrical meters at customerpremises to ensure that the meters are wired correctly and areaccurately measuring the amount of electricity used by customers. Thetest probes have exposed tips that are attached to electrical connectorsthat are coupled to test switches, which are coupled to the meters. Suchexposed tips can create a safety hazard to an operator performing a testif the operator accidentally causes the probe tip to contact a conductorthat is at a high voltage potential, for example.

BRIEF SUMMARY

Accordingly, it is desirable to provide a test probe having a probe tipand a shroud made of an electrically insulating material that at leastpartially covers the probe tip and retracts when an operator hascorrectly placed the probe tip on an electrical connector that is beingused to perform testing.

A test probe may be summarized as including: an electrically insulatinghandle; at least one electrically conducting blade extending from thehandle; an electrically insulating shroud including a first portion anda second portion that are at least partially disposed around the atleast one electrically conducting blade; a housing attached to thehandle, the first portion of the shroud being disposed within thehousing, and the second portion of the shroud extending from an apertureformed in the housing; and at least one spring disposed between thehandle and the shroud, the at least one spring biasing the shroud towardthe aperture formed in the housing.

The second portion of the shroud may have an annular end surfacepartially disposed around the at least one electrically conductingblade. The first portion of the shroud may have at least one apertureformed therein, and the at least one spring may be at least partiallydisposed within the at least one aperture formed in the first portion ofthe shroud. The handle may include an electrically insulating baseportion having a recess extending into the base portion at a first endthereof. At least one projection that extends from the base portion maybe disposed within the recess, the at least one projection may have anaperture formed therein, and the at least one spring may be partiallydisposed within the aperture formed in the at least one projection. Thefirst portion of the shroud may have at least one aperture formedtherein, and the at least one spring may be at least partially disposedwithin the at least one aperture formed in the first portion of theshroud. The base portion may include at least one mounting portion thatextends from a second end of the base portion, the second end beingopposite the first end, and the test probe may further include at leastone wire strain relief portion coupled to the at least one mountingportion. The at least one electrically conducting blade may include afirst blade and a second blade, the first blade may include a planarportion having a sloped surface that tapers toward the second blade, andthe second blade may include a planar portion having a sloped surfacethat tapers toward the first blade. The at least one spring may includea first spring and a second spring, and the at least one electricallyconducting blade may be disposed between the first spring and the secondspring.

A test probe may be summarized as including: an electrically insulatinghandle; a first electrically conducting blade extending from the handle;a second electrically conducting blade extending from the handle; anelectrically insulating material disposed between the first blade andthe second blade; an electrically insulating shroud including a firstportion and a second portion that are at least partially disposed aroundthe first electrically conducting blade, the second electricallyconducting blade, and the electrically insulating material; a housingattached to the handle, the first portion of the shroud being disposedwithin the housing, and the second portion of the shroud extending froman aperture formed in the housing; a first spring disposed between thehandle and the shroud; and a second spring disposed between the handleand the shroud, the first spring and the second spring biasing theshroud toward the aperture formed in the housing.

The first electrically conducting blade, the second electricallyconducting blade, and the electrically insulating material may bedisposed between the first spring and the second spring. The firstelectrically conducting blade may include a first planar portion and asecond planar portion that extends from the first planar portion, thefirst planar portion of the first electrically conducting blade beingperpendicular to the second planar portion of the first electricallyconducting blade, and the second electrically conducting blade mayinclude a first planar portion and a second planar portion that extendsfrom the first planar portion, the first planar portion of the secondelectrically conducting blade being perpendicular to the second planarportion of the second electrically conducting blade. The second portionof the shroud may include a plurality of projections, each of theprojections extending inwardly from an interior surface of the secondportion of the shroud. The second portion of the shroud may have anannular end surface partially disposed around the first electricallyconducting blade, the second electrically conducting blade, and theelectrically insulating material. The first electrically conductingblade may include a sloped surface disposed at one end of the firstelectrically conducting blade, the second electrically conducting blademay include a sloped surface disposed at one end of the secondelectrically conducting blade, and the second portion of the shroud mayhave an annular end surface partially disposed around the sloped surfaceof the first electrically conducting blade and the sloped surface of thesecond electrically conducting blade. The first portion of the shroudmay have a first aperture and a second aperture formed therein, thefirst spring may be at least partially disposed within the firstaperture formed in the first portion of the shroud, and the secondspring may be at least partially disposed within the second apertureformed in the first portion of the shroud. The handle may include anelectrically insulating base portion having a recess extending into thebase portion at a first end thereof. A first projection and a secondprojection that extend from the base portion may be disposed within therecess, the first spring may be partially disposed within an apertureformed in the first projection, and the second spring may be partiallydisposed within an aperture formed in the second projection. The firstportion of the shroud may have a first aperture and a second apertureformed therein, the first spring may be at least partially disposedwithin the first aperture formed in the first portion of the shroud, andthe second spring may be at least partially disposed within the secondaperture formed in the first portion of the shroud. The base portion mayinclude a first mounting portion and a second mounting portion thatextend from a second end of the base portion, the second end beingopposite the first end, and the test probe may further include a firstwire strain relief portion coupled to the first mounting portion and asecond wire strain relief portion coupled to the second mountingportion.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

FIG. 1 is a side perspective view of a test probe, according to one ormore embodiments of the present disclosure.

FIG. 2 is an exploded, side view of a test probe, according to one ormore embodiments of the present disclosure.

FIGS. 3A, 3B, and 3C are rear, side, and front views, respectively, of ahandle base portion, according to one or more embodiments of the presentdisclosure.

FIGS. 4A, 4B, and 4C are rear, side, and front views, respectively, of aprobe tip shroud, according to one or more embodiments of the presentdisclosure.

FIGS. 5A, 5B, and 5C are rear, side, and front views, respectively, of ahousing, according to one or more embodiments of the present disclosure.

FIG. 6A is a front view of a test switch terminal that can be testedusing a test probe, according to one or more embodiments of the presentdisclosure.

FIGS. 6B and 6C are side views of a portion of the test switch terminalshown in FIG. 6A with a test probe, according to one or more embodimentsof the present disclosure.

DETAILED DESCRIPTION

FIG. 1 is a side perspective view of a test probe 100, according to oneor more embodiments of the present disclosure. As shown in FIG. 1, thetest probe 100 includes a handle 102, a housing 104, a shroud 106, andprobe lead 108. An operator grasps the handle 102 to position the testprobe 100. As will be described in detail below, when the operatorplaces the tip of the probe lead 108 on an electrical connector andpushes the handle 102 toward the electrical connector, the shroud 106retracts into the housing 104 thereby exposing a portion of the probelead 108 that then makes contact with the electrical connector.

FIG. 2 is an exploded, side view of a test probe 100, according to oneor more embodiments of the present disclosure. As shown in FIG. 2, thehandle 102 includes a base portion 110. FIGS. 3A, 3B, and 3C are rear,side, and front views, respectively, of a base portion 110, according toone or more embodiments of the present disclosure.

In one or more embodiments, the base portion 110 is formed using amolding process from a polycarbonate (PC) and acrylonitrile butadienestyrene (ABS) blend that is flame retardant. The base portion 110includes a first mounting portion 112 and a second mounting portion 114that extend from a proximal end thereof. The first mounting portion 112and the second mounting portion 114 each have a first cylindricalprojection and a second cylindrical projection, which have differentouter diameters. As will be explained below, the first mounting portion112 and the second mounting portion 114 are used to attach a first wirestrain relief portion 116 and a second wire strain relief portion 118 tothe base portion 110, respectively. A first cover 120 and a second cover122 are attached using a suitable adhesive material to a central part ofthe base portion 110 where an operator grasps the handle 102. In one ormore embodiments, the first wire strain relief portion 116, the secondwire strain relief portion 118, the first cover portion 120, and thesecond cover portion 122 are formed using a molding process from athermoplastic elastomer (TPE), for example, Sarlink® 4175 which isavailable from the Teknor Apex Company.

As shown in FIG. 3B, the base portion 110 includes a recessed portion124 at a distal end thereof, and a mounting portion 126 adjacent to therecessed portion 124. A flange 127 extends outwardly from an outer wallof the base portion 110. When the test probe 100 is assembled, the probelead 108 extends from the recessed portion 124 of the base portion 110of the handle 102. As shown in FIG. 2, the probe lead 108 is comprisedof a first blade 128, a second blade 130, and a separator 132 that isdisposed between the first blade 128 and the second blade 130 andelectrically isolates the blades 128, 130 from each other. In one ormore embodiments, the first blade 128 and the second blade 130 areformed from brass, and the separator 132 is a board formed from FR-4,which is a composite material composed of woven fiberglass cloth with anepoxy resin binder that is flame resistant. The first blade 128 and thesecond blade 130 are attached to the separator 132 using a suitableadhesive material.

In one or more embodiments, the first blade 128 and the second blade 130each have a so-called duckbill configuration. More particularly, thefirst blade 128 includes a first planar portion 134 that extends alongthe separator 132 and a second planar portion 136 (see FIG. 1) that isperpendicular to the first planar portion 134 and has a sloped surface136 a at a distal end thereof that tapers toward the first planarportion 134 and the second blade 130. Similarly, the second blade 130includes a first planar portion 138 (see FIG. 2) that extends along theseparator 132 and a second planar portion 140 that is perpendicular tothe first planar portion 138 and has a sloped surface 140 a at a distalend thereof that tapers toward the first planar portion 138 and thefirst blade 128.

When the probe lead 108 is assembled, a proximal end of the probe lead108 is passed through an aperture formed in the bottom of the recessedportion 124 and the mounting portion 126. In one or more embodiments,the probe lead 108 is attached to the mounting portion 126 using asuitable adhesive material. Then, a first wire (not shown) and a secondwire (not shown) are attached the first blade 128 and the second blade130, respectively. More particularly, a first end of the first wire isattached to a first ring lug 142 using a wire crimping tool, and thenthe first ring lug 142 is attached to the first blade 128 using a firstlock washer 144 and a first bolt 146 that is rotated to advance thefirst bolt 146 into a threaded aperture formed in the first blade 128. Asecond end of the first wire is threaded through apertures formed in thefirst mounting portion 112 and the first wire strain relief portion 116,and the first wire strain relief portion 116 is attached to the firstmounting portion 112, for example, using a suitable adhesive material.Similarly, a first end of the second wire is attached to a second ringlug 148 using a wire crimping tool, and then the second ring lug 148 isattached to the second blade 130 using a second lock washer 150 and asecond bolt 152 that is rotated to advance the second bolt 152 into athreaded aperture formed in the second blade 130. A second end of thesecond wire is threaded through apertures formed in the second mountingportion 114 and the second wire strain relief portion 118, and thesecond wire strain relief portion 118 is attached to the second mountingportion 114, for example, using a suitable adhesive material. The secondends of the first wire and the second wires are attached, for example,by soldering to a first electrical connector (not shown) which isconfigured to connect or mate with to a second electrical connector (notshown) of an electrical testing device (not shown).

Attachment of the shroud 106 to the handle 102 will now be described. Asshown in FIGS. 2 and 3C, a first cylindrical projection 154 and a secondcylindrical projection 156 extend from a bottom surface of the recessedportion 124 of the base portion 110 of the handle 102. The firstcylindrical projection 154 has an aperture formed therein with an innerdiameter that is slightly larger than an outer diameter of a firstspring 158, and the second cylindrical projection 156 has an apertureformed therein with an inner diameter that is slightly larger than anouter diameter of a second spring 160. In one or more embodiments, thefirst spring 158 and the second spring 160 are substantially identicaland are torsion springs formed from nickel plated brass. The firstspring 158 is placed in the aperture of the first cylindrical projection154, and the second spring 160 is placed in the aperture of the secondcylindrical projection 156.

FIGS. 4A, 4B, and 4C are rear, side, and front views, respectively, of ashroud 106, according to one or more embodiments of the presentdisclosure. As shown in FIG. 4B, the shroud 106 includes a first portion162 and a second portion 164 that extends from the first portion 162. Asshown in FIG. 4A, the first portion 162 includes a first aperture 162 a,a second aperture 162 b, and a third aperture 162 c that is disposedbetween the first aperture 162 a and the second aperture 162 b. Thefirst aperture 162 a is cylindrical and has a diameter that is slightlylarger than the outer diameter of the first spring 158, and the secondaperture 162 b is cylindrical and has an inner diameter that is slightlylarger than the outer diameter of the second spring 160. The thirdaperture 162 c has a shape that enables the probe lead 108 to freelypass therethrough. The second portion 164 is cylindrical and has anaperture 164 a formed therein with an inner diameter that enables theprobe lead 108 to pass therethrough. As shown in FIG. 4C, the secondportion 164 includes an annular end surface 164 b at a distal endthereof, which prevents part of the sheath 106 from entering a portionof a device under test. In addition, the second portion 164 includesfour projections 164 c, wherein each projection 164 c extends radiallyinwardly from an interior surface of the second portion 164.

When the test probe 100 is assembled, one of the projections 164 c isdisposed between the first planar portion 134 and the second planarportion 136 of the first blade 128 on a first side of the second planarportion 136, and another one of the projections 164 c is disposedbetween the first planar portion 134 and the second planar portion 136of the first blade 128 on a second side of the second planar portion136. Similarly, one of the projections 164 c is disposed between thefirst planar portion 138 and the second planar portion 140 of the secondblade 130 on a first side of the second planar portion 140, and anotherone of the projections 164 c is disposed between the first planarportion 138 and the second planar portion 140 of the second blade 130 ona second side of the second planar portion 140. The projections 164 censure that the second portion 164 of the shroud 106 fits closely aroundthe lead portion 108 and does not permit dirt, for example, fromentering the second portion 164 of the shroud 106. Also, when the testprobe 100 is assembled, the probe lead 108 is disposed between the firstspring 158 and the second spring 160.

The handle 102 with the probe lead 108 extending from the recessedportion 124 is arranged such that the first spring 158 does not fall outof the first cylindrical projection 154 and the second spring 160 doesnot fall out of the second cylindrical projection 156. The shroud 106 isthen positioned adjacent to the handle 102 and moved toward the handle102 such that part of the first spring 158 is disposed within the firstaperture 162 a, part of the second spring 160 is disposed within thesecond aperture 162 b, part of the probe lead 108 is disposed within thethird aperture 162 c, and another part of the probe lead 108 is disposedwithin the aperture 164 a of the second portion 164 of the shroud 106.

The shroud 106 is then secured to the handle 102 using the housing 104,as described below. FIG. 5A is rear view of the housing 104, FIG. 5B isa side view of the housing 104, and FIG. 5C is a front view of thehousing 104, according to one or more embodiments of the presentdisclosure. As shown in FIGS. 5A and 5B, a lip 166 is formed at aproximal end of the housing 104. An aperture 168 is formed in thehousing 104. An inner diameter of the aperture 168 is smaller than anouter diameter of the first portion 162 of the shroud 106, whichprevents the first portion 162 of the shroud 106 from passing throughthe aperture 168. The inner diameter of the aperture 168 is smaller thanan outer diameter of the second portion 164 of the shroud 106, whichenables the second portion 164 of the shroud 106 to move freely throughthe aperture 168.

The proximal end of the housing 104 is placed adjacent to the partiallyassembled test probe 100 and moved toward the handle 102 such that thesecond portion 164 passes through the aperture 168 until the lip 166 ofthe housing 104 contacts the flange 127 of the base portion 110 of thehandle 102. A suitable amount of pressure is applied to the housing 104to cause the lip 166 of the housing 104 to snap fit around the flange127 thereby securing the housing 104, and thus the shroud 106, to thehandle 102. Additionally or alternatively, a suitable adhesive materialmay be used to secure the housing 104 to the handle 102. In one or moreembodiments, when the test probe 100 is not being used, the secondportion 164 of the shroud 106 leaves a small amount (e.g., less than 4mm) of the test lead 108 exposed.

Having described the structure of the test probe 100, use of the testprobe 100 will now be described with reference to FIGS. 6A, 6B, and 6C.FIG. 6A shows a test switch terminal 170 that includes a base plate 172and a plurality of electrical connectors 174, each of which isidentically configured in FIG. 6A. Each electrical connector 174includes a first portion 176 that is mounted to the base plate 172,wherein the first portion 176 includes a pair of prongs 178. Inaddition, each electrical connector 174 includes a second portion 180that is mounted to the base plate 172, wherein the second portion 180includes a pair of prongs 182. The electrical connectors 174 are formedfrom a conductive material, from example, brass. In the configurationshown in FIG. 6A, the first portion 176 and the second portion 180 ofeach of the electrical connectors 174 are electrically isolated from oneanother. The first portion 176 of each of the electrical connectors 174is electrically coupled by a wire (not shown) to one phase of athree-phase voltage and current is supplied by a utility meter (notshown). The second portion 180 of each of the electrical connectors 174is electrically coupled by a wire (not shown) to one phase of anelectrical assembly (not shown) at a customer's premises.

Prior to performing a test, the first and second wires that are attachedto the first blade 128 and the second blade 130 of the test probe 100are attached to an electrical testing device, for example, a PowerMaster3 Series Hand-held 3-Phase Meter Site Tester from Powermetrix located inKnoxville, Tenn. After the testing device is placed in an appropriatemeasurement mode, an operator grasps the handle 102 and positions thetest probe 100 such that the probe lead 108 is adjacent to the prongs178 and 182 of one of the electrical connectors 174.

FIGS. 6B and 6C are side views of a portion of the test switch terminal170, which are used to describe the operation of the test probe 100,according to one or more embodiments of the present disclosure. Someportions of the test switch terminal 170 are not shown in FIGS. 6B and6C for illustrative simplicity. FIG. 6B shows an example of the testprobe 100 positioned as described above adjacent to the prongs 178 and182 of one of the electrical connectors 174. After the test probe 100 ispositioned as shown in FIG. 6B, the operator uses the handle 102 to movethe test probe 100 toward the prongs 178 and 182 of the electricalconnector 174. As the operator moves the test probe 100 toward theprongs 178 and 182, the prongs 178 and 182 exert a force on the endsurface 164 b of the second portion 164 of the shroud 106 that causesthe shroud 106 to compress the first spring 158 and second spring 160,which enables part of the second portion 164 of the shroud 106 move orretract into the housing 104, thereby exposing more of the first blade128 and the second blade 130.

The exposed portion of the first blade 128 contacts the prongs 182, andthe exposed portion of the second blade 130 contacts the prongs 178.When the test probe 100 is positioned as shown in FIG. 6C, a currentflows from the meter to the test device via the first blade 128 and thefirst wire attached thereto, which enables the test device to measurepredetermined characteristics of the current. In addition, a currentflows from the test device to the electrical assembly at the customer'spremises via the second blade 130 and the second wire attached thereto.

After the test device has completed taking measurements, the operatorpulls on the handle 102 and moves the test probe 100 away from the testswitch terminal 170. After the test probe 100 is moved away from thetest switch terminal 170, the compressed first spring 158 and secondspring 160 exert a force on the shroud 106, which causes the causes thepart of the second portion 164 of the shroud 106 that was previouslyretracted into the housing 104 to return to its original positioncovering most of the first blade 128 and the second blade 130.

Because the shroud 106 is formed from an insulating material, if theoperator accidentally touches the covered portions of the first blade128 and the second blade 130 to a conductor that is at a high voltagepotential, the operator and test device are protected from having apotentially dangerous current flowing therethrough. The operator isprovided with additional protection because the various components ofthe handle 102 are formed from an insulating material, and there are noconductors that extend from within the test probe 100 to an exteriorportion of the handle 102.

The various embodiments described above can be combined to providefurther embodiments. These and other changes can be made to theembodiments in light of the above-detailed description. In general, inthe following claims, the terms used should not be construed to limitthe claims to the specific embodiments disclosed in the specificationand the claims, but should be construed to include all possibleembodiments along with the full scope of equivalents to which suchclaims are entitled. Accordingly, the claims are not limited by thedisclosure.

1. A test probe comprising: an electrically insulating handle; at leastone electrically conducting blade extending from the handle; anelectrically insulating shroud including a first portion and a secondportion that are at least partially disposed around the at least oneelectrically conducting blade; a housing attached to the handle, thefirst portion of the shroud being disposed within the housing, and thesecond portion of the shroud extending from an aperture formed in thehousing; and at least one spring disposed between the handle and theshroud, the at least one spring biasing the shroud toward the apertureformed in the housing.
 2. The test probe of claim 1 wherein the secondportion of the shroud has an annular end surface partially disposedaround the at least one electrically conducting blade.
 3. The test probeof claim 1 wherein the first portion of the shroud has at least oneaperture formed therein, and the at least one spring is at leastpartially disposed within the at least one aperture formed in the firstportion of the shroud.
 4. The test probe of claim 1 wherein the handleincludes an electrically insulating base portion having a recessextending into the base portion at a first end thereof.
 5. The testprobe of claim 4 wherein: at least one projection that extends from thebase portion is disposed within the recess, the at least one projectionhas an aperture formed therein, and the at least one spring is partiallydisposed within the aperture formed in the at least one projection. 6.The test probe of claim 5 wherein the first portion of the shroud has atleast one aperture formed therein, and the at least one spring is atleast partially disposed within the at least one aperture formed in thefirst portion of the shroud.
 7. The test probe of claim 4 wherein thebase portion includes at least one mounting portion that extends from asecond end of the base portion, the second end being opposite the firstend, and the test probe further includes at least one wire strain reliefportion coupled to the at least one mounting portion.
 8. The test probeof claim 1 wherein: the at least one electrically conducting bladeincludes a first blade and a second blade, the first blade includes aplanar portion having a sloped surface that tapers toward the secondblade, and the second blade includes a planar portion having a slopedsurface that tapers toward the first blade.
 9. The test probe of claim 1wherein the at least one spring includes a first spring and a secondspring, and the at least one electrically conducting blade is disposedbetween the first spring and the second spring.
 10. A test probecomprising: an electrically insulating handle; a first electricallyconducting blade extending from the handle; a second electricallyconducting blade extending from the handle; an electrically insulatingmaterial disposed between the first blade and the second blade; anelectrically insulating shroud including a first portion and a secondportion that are at least partially disposed around the firstelectrically conducting blade, the second electrically conducting blade,and the electrically insulating material; a housing attached to thehandle, the first portion of the shroud being disposed within thehousing, and the second portion of the shroud extending from an apertureformed in the housing; a first spring disposed between the handle andthe shroud; and a second spring disposed between the handle and theshroud, the first spring and the second spring biasing the shroud towardthe aperture formed in the housing.
 11. The test probe of claim 10wherein the first electrically conducting blade, the second electricallyconducting blade, and the electrically insulating material are disposedbetween the first spring and the second spring.
 12. The test probe ofclaim 10 wherein: the first electrically conducting blade includes afirst planar portion and a second planar portion that extends from thefirst planar portion, the first planar portion of the first electricallyconducting blade being perpendicular to the second planar portion of thefirst electrically conducting blade, and the second electricallyconducting blade includes a first planar portion and a second planarportion that extends from the first planar portion, the first planarportion of the second electrically conducting blade being perpendicularto the second planar portion of the second electrically conductingblade.
 13. The test probe of claim 10 wherein the second portion of theshroud includes a plurality of projections, each of the projectionsextending inwardly from an interior surface of the second portion of theshroud.
 14. The test probe of claim 10 wherein the second portion of theshroud has an annular end surface partially disposed around the firstelectrically conducting blade, the second electrically conducting blade,and the electrically insulating material.
 15. The test probe of claim 10wherein: the first electrically conducting blade includes a slopedsurface disposed at one end of the first electrically conducting blade,the second electrically conducting blade includes a sloped surfacedisposed at one end of the second electrically conducting blade, and thesecond portion of the shroud has an annular end surface partiallydisposed around the sloped surface of the first electrically conductingblade and the sloped surface of the second electrically conductingblade.
 16. The test probe of claim 10 wherein: the first portion of theshroud has a first aperture and a second aperture formed therein, thefirst spring is at least partially disposed within the first apertureformed in the first portion of the shroud, and the second spring is atleast partially disposed within the second aperture formed in the firstportion of the shroud.
 17. The test probe of claim 10 wherein the handleincludes an electrically insulating base portion having a recessextending into the base portion at a first end thereof.
 18. The testprobe of claim 17 wherein: a first projection and a second projectionthat extend from the base portion are disposed within the recess, thefirst spring is partially disposed within an aperture formed in thefirst projection, and the second spring is partially disposed within anaperture formed in the second projection.
 19. The test probe of claim 18wherein: the first portion of the shroud has a first aperture and asecond aperture formed therein, the first spring is at least partiallydisposed within the first aperture formed in the first portion of theshroud, and the second spring is at least partially disposed within thesecond aperture formed in the first portion of the shroud.
 20. The testprobe of claim 17 wherein the base portion includes a first mountingportion and a second mounting portion that extend from a second end ofthe base portion, the second end being opposite the first end, and thetest probe further includes a first wire strain relief portion coupledto the first mounting portion and a second wire strain relief portioncoupled to the second mounting portion.